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Transmission Electron Microscopy (TEM)


Electron microscopes are essential tools for characterizing nanomaterials as they provide an array of information such as topography, morphology, composition and crystallographic information. The Electron Microscope Facility (EM Facility) at CSIR-IICT, Hyderabad comprises a FEI Tecnai FE12 Transmission Electron Microscopy instrument. It can be used to perform conventional transmission electron microscopy (TEM) with thin-sectioned specimens, and other transmission electron microscopy with specimens prepared using other methods. It is an easy-to-use, high contrast, instrument with excellent imaging and analytical capabilities in one compact package. With an easily changeable accelerating voltage range of 40-120 KeV, the TECNAI FE12 TEM is highly suitable for polymer, biological, and materials science applications. The resolution is of the order of 0.34 nm (point) and 0.20 nm (line) at 700,000 x magnification. The instrument is equipped with a goniometer specimen stage for stereoscopic imaging and images are recorded using a large field of view, side mounted, digital image acquisition CCD camera with imaging software (SIS Imaging Software).

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